Instrument supervisor: Omri Dvir
SCANNING ELECTRON MICROSCOPY
The SEM can be used to examine surface details of solid materials. Internal surfaces
can be exposed by sectioning or fracturing. It is equipped with an energy dispersive
spectrometer which permits qualitative and quantitative compositional analysis.
Image analysis software permits detection, measurement and analysis of features of
interest.
IMAGING TECHNIQUES
Secondary electron imaging (morphology and surface topography)
Backscattered electron imaging (compositional contrast and phase distribution)
Digital image collection, enhancement and analysis
ANALYTICAL MODES
Elemental recognition and phase identification
Quantitative compositional analysis
Digital x-ray maps and linescans
Analysis of particle samples
INSTRUMENTATION
JEOL JSM6400 Digital SEM with:
EDS (oxford) Energy Dispersive X-ray Analyzer