Scanning Electron Microscopy (SEM)

Instrument supervisor: Omri Dvir

SCANNING ELECTRON MICROSCOPY

The SEM can be used to examine surface details of solid materials. Internal surfaces

can be exposed by sectioning or fracturing. It is equipped with an energy dispersive

spectrometer which permits qualitative and quantitative compositional analysis.

Image analysis software permits detection, measurement and analysis of features of

interest.

IMAGING TECHNIQUES

Secondary electron imaging (morphology and surface topography)

Backscattered electron imaging (compositional contrast and phase distribution)

Digital image collection, enhancement and analysis

ANALYTICAL MODES

Elemental recognition and phase identification

Quantitative compositional analysis

Digital x-ray maps and linescans

Analysis of particle samples

INSTRUMENTATION

JEOL JSM6400 Digital SEM with:

EDS (oxford) Energy Dispersive X-ray Analyzer

 

  • electron probe
  • Neev center Seismic survey
  • Paleomagnetic Lab
  • Paleomagnetic Lab
  • Lab
  • Spectrometer
  • dsc
  • icpms